Positive exchange bias in a Ni80Fe20/NixFe1-xO thin-film bilayer

Journal of Magnetism and Magnetic Materials

Volumn 304, Issue 1, 2006, Pages

  Lin, K W ^a   Tzeng, Y M ^a   Guo, Z Y ^a   Liu, C Y ^a   van Lierop, J ^b  

^a NATIONAL CHUNG HSING UNIVERSITY   (Taiwan)

^b UNIVERSITY OF MANITOBA   (Canada)

Author keywords

Exchange bias; Ion beam sputter deposition; Thin film

Indexed keywords

HALL EFFECT; ION BEAMS; NANOSTRUCTURED MATERIALS; NICKEL COMPOUNDS; OXYGEN; SPUTTER DEPOSITION;

EXCHANGE BIAS; ION-BEAM SPUTTER DEPOSITION; THIN-FILM NANOCRYSTALLITE SYSTEM;

THIN FILMS;

EID: 33646877480     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2006.02.021     Document Type: Article

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