Cooling field and ion-beam bombardment effects on exchange bias behavior in NiFe/(Ni,Fe)0 bilayers

Journal of Nanoscience and Nanotechnology

Volumn 9, Issue 3, 2009, Pages 2023-2029

  Lin, K W ^a   Wei, M R ^a   Guo, J Y ^a  

^a NATIONAL CHUNG HSING UNIVERSITY   (Taiwan)

Author keywords

Exchange bias; Ion beam bombardment

Indexed keywords

APPLIED MAGNETIC FIELDS; BI-LAYER; COOLING FIELDS; DEPOSITION VOLTAGE; EXCHANGE BIAS; EXCHANGE BIAS EFFECTS; EXCHANGE FIELDS; ION ENERGIES; SURFACE LAYERS; SURFACE SPINS; ZERO-FIELD-COOLED;

COOLING; ION BEAMS; ION BOMBARDMENT; IONS; MAGNETIC FIELDS; NICKEL; SPIN DYNAMICS;

ION EXCHANGE;

EID: 65249084358     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2009.382     Document Type: Conference Paper

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