Single-event-upset-like fault injection: A comprehensive framework

IEEE Transactions on Nuclear Science

Volumn 52, Issue 6, 2005, Pages 2205-2209

  Faure, Fabien ^a,b   Velazco, Raoul ^a,b   Peronnard, Paul ^b  

^a IEEE   (France)

^b TIMA LABORATORY   (France)

Author keywords

Fault injection; Microprocessor; Single event upsets

Indexed keywords

FAULT INJECTION; SINGLE EVENT UPSETS;

FAILURE ANALYSIS; MICROPROCESSOR CHIPS; RADIATION EFFECTS;

NUCLEAR ENERGY;

EID: 33144471311     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2005.860689     Document Type: Conference Paper

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