Modeling Single-Event Effects in a Complex Digital Device

IEEE Transactions on Nuclear Science

Volumn 50, Issue 6 I, 2003, Pages 2069-2080

  Clark, Kenneth A ^a   Ross, Alan A ^b   Loomis, Hersch H ^b   Weatherford, Todd R ^b   Fouts, Douglas J ^b   Buchner, Stephen P ^c   McMorrow, Dale ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

^b NAVAL POSTGRADUATE SCHOOL   (United States)

^c QSS GROUP INC   (United States)

Author keywords

Fault modeling; Fault propagation; Radiation effects; Single event effects; Single event transients; Single event upsets; Transient propagation

Indexed keywords

ELECTRIC POTENTIAL; ENERGY TRANSFER; LOGIC GATES; PROBABILITY; RADIATION EFFECTS;

FAULT MODELING; FAULT PROPAGATION; SINGLE-EVENT EFFECTS; SINGLE-EVENT TRANSIENTS; SINGLE-EVENT UPSETS; TRANSIENT PROPAGATION;

DIGITAL DEVICES;

EID: 1242333065     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2003.821793     Document Type: Conference Paper

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