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Volumn 18, Issue 6, 2008, Pages

Gold/tin soldering of flexible silicon chips onto polymer tapes

Author keywords

[No Author keywords available]

Indexed keywords

BRAZING; FINITE ELEMENT METHOD; MICROSYSTEMS; POLYIMIDES; POLYMERS; SILICON; WELDING;

EID: 57349117070     PISSN: 09601317     EISSN: 13616439     Source Type: Journal    
DOI: 10.1088/0960-1317/18/6/064002     Document Type: Conference Paper
Times cited : (8)

References (18)
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    • Reactively sputtered iridium oxide-influence of plasma excitation and substrate temperature on morphology, composition and electrochemical characteristic
    • Wessling B, Besmehn A, Mokwa W and Schnakenberg U 2007 Reactively sputtered iridium oxide - influence of plasma excitation and substrate temperature on morphology, composition and electrochemical characteristic J. Electrochem. Soc. 154 83-9
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    • Wessling, B.1    Besmehn, A.2    Mokwa, W.3    Schnakenberg, U.4
  • 4
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    • Eleminating backgrind defects with wet chemical etching
    • McHatton C and Gumbert C M 1998 Eliminating backgrind defects with wet chemical etching Solid State Technol. 46 836-45
    • (1998) Solid State Technol. , vol.46 , pp. 836-845
    • McHatton, C.1    Gumbert, C.M.2
  • 5
    • 25644458679 scopus 로고    scopus 로고
    • Current and future uses of gold in electronics
    • Goodman P 2002 Current and future uses of gold in electronics Gold Bull. 35 21-6
    • (2002) Gold Bull. , vol.35 , pp. 21-26
    • Goodman, P.1
  • 9
    • 0005653216 scopus 로고
    • The thermal expansion of our metals: Copper, gold, aluminum, nickel, and iron
    • Nix F C and MacNair D 1941 The thermal expansion of our metals: copper, gold, aluminum, nickel, and iron Phys. Rev. 60 597-605
    • (1941) Phys. Rev. , vol.60 , Issue.8 , pp. 597-605
    • Nix, F.C.1    MacNair, D.2
  • 11
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    • Coefficient of thermal expansion of sulphamate nickel electrodeposits
    • Dini J W and Johnson H R 1976 Coefficient of thermal expansion of sulphamate nickel electrodeposits J. Mater. Sci. 10 1253-4
    • (1976) J. Mater. Sci. , vol.10 , Issue.7 , pp. 1253-1254
    • Dini, J.W.1    Johnson, H.R.2
  • 15
    • 0010039920 scopus 로고    scopus 로고
    • The thermophysical properties (heat capacity and thermal expansion) of single-crystal silicon
    • Glazov V M and Pashinkin A S 2001 The thermophysical properties (heat capacity and thermal expansion) of single-crystal silicon J. High Temp. 39 413-9
    • (2001) J. High Temp. , vol.39 , Issue.3 , pp. 413-419
    • Glazov, V.M.1    Pashinkin, A.S.2
  • 16
    • 29344441935 scopus 로고    scopus 로고
    • Thermo-mechanical stress analysis and measurement in quasi-monolithic integration technology (QMIT)
    • Joodaki M, Kompa G and Hillmer H 2005 Thermo-mechanical stress analysis and measurement in quasi-monolithic integration technology (QMIT) IEEE Trans. Device Mater. Reliab. 5 581-94
    • (2005) IEEE Trans. Device Mater. Reliab. , vol.5 , Issue.3 , pp. 581-594
    • Joodaki, M.1    Kompa, G.2    Hillmer, H.3
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    • H D 2008 Microsystems Data Sheet for PI2611
    • (2008)
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    • Thermal expansion and elastic properties of high gold-tin alloys
    • Yost F G, Karnowsky M M, Drotning W D and Gieske J H 1990 Thermal expansion and elastic properties of high gold-tin alloys Metall. Trans. A 21 1885-9
    • (1990) Metall. Trans. , vol.21 , Issue.7 , pp. 1885-1889
    • Yost, F.G.1    Karnowsky, M.M.2    Drotning, W.D.3    Gieske, J.H.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.