Direct growth of carbon nanotubes on a micro-sized cobalt tip and characterization of electron-emission properties

Thin Solid Films

Volumn 517, Issue 3, 2008, Pages 1136-1140

  Kim, Jong Pil ^a   Kim, Young Kwang ^a   Park, Chang Kyun ^a   Choi, Hae Young ^b   Kim, Jong Uk ^b   Park, Jin Seok ^a  

^a Hanyang University   (South Korea)

^b Korea Electrotechnology Research Institute (KERI)   (South Korea)

Author keywords

Carbon nanotubes (CNTs); Cobalt tip; Direct growth; Electron emission properties; Inductively coupled plasma Chemical vapor deposition (ICP CVD); Stability; X ray imaging

Indexed keywords

CARBON; CATALYSIS; CHEMICAL PROPERTIES; CHEMICAL STABILITY; CHEMICAL VAPOR DEPOSITION; COBALT; ELECTRON EMISSION; EMISSION SPECTROSCOPY; FIELD EMISSION; INDUCTIVELY COUPLED PLASMA; NANOCOMPOSITES; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; NANOTUBES; PHOTORESISTS; PLASMA DEPOSITION; PLASMA STABILITY; PLASMAS; TIN; TITANIUM COMPOUNDS; TITANIUM NITRIDE; TRANSITION METALS; VAPORS;

CATALYST LAYERS; CRYSTALLINE STRUCTURES; DIRECT GROWTH; DIRECT GROWTHS; EMISSION CHARAC-TERISTICS; EMISSION CURRENTS; EMISSION PROPERTIES; FIELD EMITTERS; HIGH RESOLUTIONS; ICP-CVD; IMPROVED PERFORMANCES; MORPHO-LOGIES; X-RAY IMAGING;

CARBON NANOTUBES;

EID: 56649086657     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2008.08.174     Document Type: Article

References (17)

1. Zhang L., Balzano L., and Resasco D.E. J. Phys. Chem., B 109 (2005) 14375
2. Zhu W., Bower C., Zhou O., Kochanski G., and Jin S. Appl. Phys. Lett. 75 (1999) 873
3. Hsu D.S.Y., and Shaw J. Appl. Phys. Lett. 80 (2002) 118
4. Choi W.B., Chung D.S., Kang J.H., Kim H.Y., Jin Y.W., Han I.T., Lee Y.H., Jung J.E., Lee N.S., Park G.S., and Kim J.M. Appl. Phys. Lett. 75 (1999) 3129
5. Bonard J.M., Stockli T., Noury O., and Chatelain A. Appl. Phys. Lett. 78 (2001) 2775
6. Liu Z., Yang G., Lee Y.Z., Bordelon D., Lu J., and Zhou O. Appl. Phys. Lett. 89 (2006) 103111
7. Teo K.B.K., Chhowalla M., Amaratunga G.A.J., Milne W.I., Legagneux P., Pirio G., Gangloff L., Pribat D., Semet V., Binh V.T., Bruenger W.H., Eichholz J., Hanssen H., Friedrich D., Lee S.B., Hasko D.G., and Ahmed H. J. Vac. Sci. Technol., B 21 (2003) 693
8. Abe M., Murata K., Ataka T., and Matsumoto K. Nanotechnology 19 (2008) 045505
9. Sugie H., Tanemura M., Filip V., Takahashi K., and Okuyama F. Appl. Phys. Lett. 78 (2001) 2578
10. Ferrer D., Tanii T., Matsuya I., Zhong G., Okamoto S., Shinada T., and Ohdomari I. Appl. Phys. Lett. 88 (2006) 033116
11. Han J.H., Lee T.Y., Kim D.Y., Yoo J.B., Park C.Y., Choi J.J., Jung T., Han I.T., and Kim J.M. Diamond Relat. Mater. 13 (2004) 987
12. Baker R.T.K. Carbon 27 (1989) 315
13. Srivastava S.K., Vankar V.D., and Kumar V. Thin Solid Films 515 (2006) 1552
14. Sveningsson M., Morjan R.E., Nerushev O.A., Sato Y., Backstrom J., Campbell E.E.B., and Rohmund F. Appl. Phys., A 73 (2001) 409
15. Park C.K., Kim J.P., Kim Y.D., Uhm H.S., and Park J.S. Thin Solid Films 469 (2004) 142
16. Hu Y., Huo K., Chen H., Lu Y., Xu L., Hu Z., and Chen Y. Mater. Chem. Phys. 100 (2006) 477
17. Zhong D.Y., Zhang G.Y., Liu S., Sakurai T., and Wang E.G. Appl. Phys. Lett. 80 (2002) 506