Optically detected X-ray absorption spectroscopy measurements as a means of monitoring corrosion layers on copper

Analytical Chemistry

Volumn 80, Issue 22, 2008, Pages 8717-8724

  Dowsett, Mark G ^a   Adriaens, Annemie ^b   Jones, Gareth K C ^a   Poolton, Nigel ^c   Fiddy, Steven ^d,e   Nikitenko, Sergé ^f  

^a UNIVERSITY OF WARWICK   (United Kingdom)

^b GHENT UNIVERSITY   (Belgium)

^c ABERYSTWYTH UNIVERSITY   (United Kingdom)

^d DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^e DARESBURY LABORATORY   (United Kingdom)

^f EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; COPPER; CORROSION; ELECTROMAGNETIC WAVE ABSORPTION; ELECTROMAGNETIC WAVES; EMISSION SPECTROSCOPY; ENERGY ABSORPTION; FLUORESCENCE; LIGHT; LIGHT EMISSION; LIGHT SOURCES; LIGHTING; LUMINESCENCE; MEDICAL IMAGING; METAL RECOVERY; METALLIC COMPOUNDS; MULTIPHOTON PROCESSES; NANOSTRUCTURES; OPTICAL DATA PROCESSING; PHOTONS; SODIUM; SUBSTRATES; SURFACES; X RAY ABSORPTION; X RAY ABSORPTION SPECTROSCOPY; X RAY ANALYSIS; X RAY SPECTROSCOPY; X RAYS;

COMPLEMENTARY INFORMATIONS; COPPER SUBSTRATES; CORROSION PRODUCTS; COUNTING STATISTICS; ELECTROCHEMICAL TREATMENTS; EMISSION OF ELECTRONS; END STATIONS; ENVIRONMENTAL CELLS; FINE STRUCTURES; MARINE ENVIRONMENTS; MONITORING CORROSIONS; OPTICAL EMISSIONS; OPTICAL MEASUREMENTS; OPTICAL PHOTONS; OPTICAL RADIATIONS; OPTICAL-; SECONDARY FLUORESCENCES; SODIUM SESQUICARBONATES; SPECTROSCOPY MEASUREMENTS; STATISTICAL FLUCTUATIONS; THIN SURFACE LAYERS; VISIBLE PHOTONS; X-RAY FLUORESCENCES;

ABSORPTION SPECTROSCOPY;

COPPER; SODIUM DERIVATIVE; SODIUM SESQUICARBONATE; UNCLASSIFIED DRUG;

ABSORPTION SPECTROSCOPY; ARTICLE; CORROSION; ELECTROCHEMICAL ANALYSIS; ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY; ELECTRON; PHOTON; ROENTGEN SPECTROSCOPY; X RAY FLUORESCENCE;

EID: 56449089144     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac800895n     Document Type: Article

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