High-sensitivity instrumentation for spectrally-resolved optically detected X-ray absorption spectroscopy

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 225, Issue 4, 2004, Pages 590-598

  Poolton, N R J ^a   Botter Jensen L ^b   Denby, P M ^b   Nakamura, T ^c   Hamilton, B ^d   Pantos, E ^a  

^a DARESBURY LABORATORY   (United Kingdom)

^b TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

^c SHIZUOKA UNIVERSITY   (Japan)

^d UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

Luminescence; OD XAS; Spectrometer; Synchrotron; XAS; XEOL

Indexed keywords

ABSORPTION; CHROMATOGRAPHY; LIGHT EMITTING DIODES; LUMINESCENCE; PHOTODETECTORS; SEMICONDUCTOR DEVICES; SENSITIVITY ANALYSIS; SIGNAL PROCESSING; SYNCHROTRONS; X RAY SPECTROSCOPY;

INTERFERENCE ANALYSIS; OD-XAS; XAS; XEOL;

NUCLEAR INSTRUMENTATION;

EID: 4544326045     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2004.05.003     Document Type: Article

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