A low-profile monolithic multi-element Ge detector for X-ray fluorescence applications

Journal of Synchrotron Radiation

Volumn 6, Issue 2, 1999, Pages 62-63

  Derbyshire, Gareth ^a   Cheung, Kan Cheung ^b   Sangsingkeow, Pat ^c   Samar Hasnain, S ^a,b  

^a DARESBURY LABORATORY   (United Kingdom)

^b DE MONTFORT UNIVERSITY   (United Kingdom)

^c ORTEC Inc   (United States)

Author keywords

Fluorescence detectors; High count rates; MAD; X ray detectors; XAFS

Indexed keywords

EID: 0033464412     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049598017695     Document Type: Article

References (5)

1. Cramer, S. P., Tench, O., Yocum, M. & George, G. N. (1988). Nucl. Instrum. Methods, A266, 586-591.
2. Derbyshire, G. (1991). Proceedings of the European Workshop on X-ray Detectors for Synchrotron Radiation Sources, edited by A. H. Walenta, pp. 172-175.
3. Farrow, R. C. Headspith, J., Dent, A. J., Dobson, B. R., Bilsborrow, R. L., Ramsdale, C. A., Stephenson, P. C., Brierley, S., Derbyshire, G. E., Sangsingkeow, P. & Buxton, K. (1998). J. Synchrotron Rad. 5, 845-847.
4. Hasnain, S. S., Diakun, G. P., Quinn, P. D., Wardell, E. M. & Garner, C. D. (1984). J. Phys. E, 17(1), 40-43.
5. Jacklevic, J., Kirby, J. A., Klein, M. P., Robertson, A. S., Brown, G. S. & Eisenberger, P. (1977). Solid State Commun. 23, 679-682.