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Volumn 53, Issue 4, 2008, Pages 1982-1986

Structural characteristics of sputter-deposited Pb(Zr,Ti)O3/ZnO heterostructure films

Author keywords

Oxygen annealing; PZT ZnO heterostructure; Rf sputtering; X ray diffraction

Indexed keywords


EID: 55949108800     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: 10.3938/jkps.53.1982     Document Type: Article
Times cited : (3)

References (18)
  • 15
    • 0036648931 scopus 로고    scopus 로고
    • H.-S. Kang and W.-J. Lee, J. Vac. Sei. Tech. A 20, 1498 (2002).
    • H.-S. Kang and W.-J. Lee, J. Vac. Sei. Tech. A 20, 1498 (2002).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.