Statistical neuro-space mapping technique for large-signal modeling of nonlinear devices

IEEE Transactions on Microwave Theory and Techniques

Volumn 56, Issue 11, 2008, Pages 2453-2467

  Zhang, Lei ^a   Zhang, Qi Jun ^a   Wood, John ^b  

^a CARLETON UNIVERSITY   (Canada)

^b FREESCALE SEMICONDUCTOR INC   (United States)

Author keywords

Neural networks; Semiconductor device modeling; Space mapping; Statistical modeling

Indexed keywords

CONFORMAL MAPPING; HETEROJUNCTION BIPOLAR TRANSISTORS; MICROWAVE DEVICES; MICROWAVES; NEURAL NETWORKS; PARAMETER EXTRACTION; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE MODELS; STATISTICS;

ACCURACY LIMITATIONS; COMPACT SETS; DEVICE MODELS; EXISTING METHODS; LINEAR MAPPINGS; MAPPING FUNCTIONS; MAPPING TECHNIQUES; MICROWAVE TRANSISTORS; NEURAL-NETWORK; NEW TECHNIQUES; NON-LINEAR DEVICES; NONLINEAR MAPPINGS; NONLINEAR MICROWAVES; SEMICONDUCTOR DEVICE MODELING; SIGNAL DATUMS; SMALL SIGNALS; SPACE MAPPING; SPACE MAPPING TECHNIQUES; SPACE MAPPINGS; STATISTICAL ANALYSIS; STATISTICAL MODELING; STATISTICAL MODELS; STATISTICAL PARAMETERS; STATISTICAL VARIABLES; STATISTICAL VARIATIONS; TRAINING METHODS;

POPULATION STATISTICS;

EID: 55849149769     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2008.2004894     Document Type: Article

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