Nonlinear statistical modeling and yield estimation technique for use in monte carlo simulations

IEEE Transactions on Microwave Theory and Techniques

Volumn 48, Issue 12, 2000, Pages 2316-2324

  Swidzinski, Jan F ^a   Chang, Kai ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

Algorithms; Design automation; Microwave fieldeffect transistors (fets); Modeling; Monte carlo methods; Random number generation; Statistical databases; Yield estimation

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; EQUIVALENT CIRCUITS; HIGH ELECTRON MOBILITY TRANSISTORS; INTEGRATED CIRCUIT LAYOUT; MONTE CARLO METHODS; RANDOM NUMBER GENERATION; SCATTERING PARAMETERS; SEMICONDUCTOR DEVICE MODELS;

EQUIVALENT CIRCUIT PARAMETERS (ECP);

MICROWAVE INTEGRATED CIRCUITS;

EID: 0034427507     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.898980     Document Type: Article

References (24)

1. R. Anholt, R. Worely, and R. Neidhard, "Statistical analysis of GaAs MESFET S-parameter equivalent-circuit models," Microwave and Millimeter-Wave Computer-Aided Design, vol. 1, no. 3, pp. 263-270, Mar. 1991.
2. J. Carroll, K. Whelan, S. Pritchett, and D. Bridges, "FET parameter orthogonalization with principal components," in IEEE MTT-S Int. Microwave Symp. Dig., 1994, pp. 409-412.
3. M. Petzold, J. Purviance, and C. Potratz, "An efficient linear statistical FET model," IEEE MTT-S Int. Microwave Symp. Dig., pp. 375-378, 1989.
4. J. Purviance, M. Petzold, and C. Potratz, "A linear statistical FET model using principal component analysis," IEEE Trans. Microwave Theory Tech., vol. 37, pp. 1389-1394, Sept. 1989.
5. J.W. Bandler, R. M. Biernacki, S. H. Chen, J. F. Loman, M. L. Renault, and Q. J. Zhang, "Combined discrete/normal statistical modeling of microwave devices," in Proc. IEEE 19th Eur. Microwave Conf., London, U.K., Sept. 1989, pp. 205-210.
6. J. W. Bandler, R. M. Biernacki, Q. Cai, and S. H. Chen, "A novel approach to statistical modeling using cumulative probability distribution fitting," in IEEE MTT-S Int. Microwave Symp. Dig., 1994, pp. 385-388.
7. M. D. Meehan and D. M. Collins, "Investigations of the GaAs FET model to assess its applicability to design centering and yield estimation,", EE's of Development Rep., Dec. 1987.
8. R. Anholt, J. King, R. Worely, and J. Gillespie, "Relationship between process and materials variations and variations in S- and equivalent circuit parameters," Microwave and Millimeter-Wave Computer-Aided Design, vol. 1, no. 3, pp. 271-281, July 1991.
9. R. A. Johnson and D. W. Wichern, Applied Multivariate Methods.. Englewood Cliffs, NJ: Prentice-Hall, 1992.
10. R. M. Biernacki and M. Styblinski, "Efficient performance function interpolation scheme and its application to statistical circuit design," Int. J. Circuit Theory Applicat., vol. 19, pp. 403-422, 1991.
11. A. G. Ivakhnenko, "The group method of data handling-A rival to stochastic approximation," Soviet Automatic Control, vol. 13, no. 3, 1968.
12. -, "Polynomial theory of complex systems," IEEE Trans. Syst., Man, Cybern., 1971.
13. A. J. Strojwas and S. W. Director, "An Efficient Algorithm for Parametric Fault Simulation of Monolithic ICs," SRC-CMU, Cent. for CAD, Dept. of Electrical and Computer Engineering., Carnegie-Mellon Univ., Res. Rep. CMU CAD-84-22, Feb. 1984.
14. M. A. Styblinski and S. A. Aftab, "Combination of interpolation and self-organizing approximation techniques-A new approach to circuit performance modeling," IEEE Trans. Computer-Aided Design, vol. 12, pp. 1775-1785, Nov. 1993.
15. M. D. Meehan et al., Yield and Reliability in Microwave Circuit and System Design. Boston, MA: Artech House, 1993.
16. D. E. Hocevar, M. R. Lightner, and T. N. Trick, "A study of variance reduction techniques for estimating circuit yields," IEEE Trans. Computer-Aided Design, vol. CAD-2, pp. 180-192, July 1983.
17. M. D. Kay, R. J. Beckman, and W. J. Conover, "A comparison of three methods for selecting values of input variables in the analysis of output from a computer code," Technometrics, vol. 21, no. 2, May 1979.
18. M. Keramat and R. Kielbasa, "Modified latin hypercube sampling Monte Carlo (MLHSC) estimation for average quality index," Int. Jour. Analog Integrated Circuits Signal Process., vol. 19, no. 1, pp. 87-98, Apr. 1999.
19. Triquint Semiconductor, Dallas, TX, Mar. 1999.
20. S-PLUS Users Manual ver. 3.2. Seattle, WA: Statistical Sciences, 1993.
21. HP Series IV Reference Manual. Santa Rosa, CA: Hewlett-Packard, 1996.
22. Y. Huang and C. Sheng, "The influence of pseudo-random numbers on yield analysis and optimization of microwave circuits," in IEEE MTT-S Int. Microwave Symp. Dig., 1994, pp. 377-380.
23. P. Brately, B. L. Fox, and L. E. Schrage, A Guide to Simulation. New York: Springer-Verlag, 1987.
24. M. D. Meehan, "Statistical techniques for objective characterization of microwave device statistical data," in IEEE MTT-S Int. Microwave Symp. Dig., 1991, pp. 1209-1212.