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Volumn 150, Issue 2, 2003, Pages 95-103

Statistical nonlinear model of MESFET and HEMT devices

Author keywords

[No Author keywords available]

Indexed keywords

DATABASE SYSTEMS; ELECTRIC POTENTIAL; HIGH ELECTRON MOBILITY TRANSISTORS; INTEGRATED CIRCUITS; MATHEMATICAL MODELS; NONLINEAR SYSTEMS; SEMICONDUCTING GALLIUM ARSENIDE; STATISTICAL METHODS; TRANSCONDUCTANCE;

EID: 0038320346     PISSN: 13502409     EISSN: None     Source Type: Journal    
DOI: 10.1049/ip-cds:20030334     Document Type: Article
Times cited : (12)

References (11)
  • 1
    • 0024137515 scopus 로고
    • FET model statistics and their effects on design centering and yield prediction for microwave amplifiers
    • PURVIANCE, J., CRISS, D., and MONTEITH, D.: 'FET model statistics and their effects on design centering and yield prediction for microwave amplifiers', IEEE MTT-S Int. Microw. Symp. Dig., 1988, pp. 315-318
    • (1988) IEEE MTT-S Int. Microw. Symp. Dig. , pp. 315-318
    • Purviance, J.1    Criss, D.2    Monteith, D.3
  • 3
    • 84985348170 scopus 로고
    • Statistical analysis of GaAs MESFET S-parameter equivalent-circuit models
    • ANHOLT, R., WORLEY, R., and NEIDHARD, R.: 'Statistical analysis of GaAs MESFET S-parameter equivalent-circuit models', Int. J. Microw. Millim-Wave Comput.-Aided Eng., 1991, 1, (3), pp. 263-270
    • (1991) Int. J. Microw. Millim-Wave Comput.-Aided Eng. , vol.1 , Issue.3 , pp. 263-270
    • Anholt, R.1    Worley, R.2    Neidhard, R.3
  • 4
    • 0024735619 scopus 로고
    • A linear statistical FET model using principal component analysis
    • PURVIANCE, J.E., PETZOLD, M.C., and POTRATZ, C.: 'A linear statistical FET model using principal component analysis', IEEE Trans. Microw. Theory Tech., 1989, 37, (9), pp. 1389-1394
    • (1989) IEEE Trans. Microw. Theory Tech. , vol.37 , Issue.9 , pp. 1389-1394
    • Purviance, J.E.1    Petzold, M.C.2    Potratz, C.3
  • 6
    • 0033724442 scopus 로고    scopus 로고
    • A novel nonlinear statistical modeling technique for microwave devices
    • SWIDZINSKI, J.F., and CHANG, K.: 'A novel nonlinear statistical modeling technique for microwave devices', IEEE MTT-S Int. Microw. Symp. Dig., 2000, pp. 887-890
    • (2000) IEEE MTT-S Int. Microw. Symp. Dig. , pp. 887-890
    • Swidzinski, J.F.1    Chang, K.2
  • 7
    • 0034427507 scopus 로고    scopus 로고
    • Nonlinear statistical modeling and yield estimation technique for use in Monte Carlo simulations [microwave devices and ICs]
    • SWIDZINSKI, J.F., and CHANG, K.: 'Nonlinear statistical modeling and yield estimation technique for use in Monte Carlo simulations [microwave devices and ICs]', IEEE Trans. Microw. Theory Tech., 2000, 48, (12), pp. 2316-2324
    • (2000) IEEE Trans. Microw. Theory Tech. , vol.48 , Issue.12 , pp. 2316-2324
    • Swidzinski, J.F.1    Chang, K.2
  • 8
    • 0033525328 scopus 로고    scopus 로고
    • A new algorithm to extract the nonlinear model of MESFET's and HEMT's
    • DIMARTINO, A., PISA, S., TOMMASINO, P., and TRIFILETTI, A.: 'A new algorithm to extract the nonlinear model of MESFET's and HEMT's', Microw. Opt. Technol. Lett., 1999, 20, (5), pp. 297-302
    • (1999) Microw. Opt. Technol. Lett. , vol.20 , Issue.5 , pp. 297-302
    • Dimartino, A.1    Pisa, S.2    Tommasino, P.3    Trifiletti, A.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.