Nonlinear statistical modeling of large-signal device behavior

IEEE MTT-S International Microwave Symposium Digest

Volumn 1, Issue , 2001, Pages 2071-2074

  Stiebler, Wolfram ^a   Rose, Fred ^a   Selin, John ^a  

^a RAYTHEON COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; MATHEMATICAL MODELS; MONTE CARLO METHODS; PRINCIPAL COMPONENT ANALYSIS; REGRESSION ANALYSIS; STATISTICAL METHODS;

DRAIN CURRENT; LARGE-SIGNAL DEVICE BEHAVIOR; NONLINEAR STATISTICAL MODELING; PINCH-OFF VOLTAGE;

MONOLITHIC MICROWAVE INTEGRATED CIRCUITS;

EID: 0035686347     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

1. Yield optimization of a MMIC distributed amplifier using physically-based device models
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3. CAD for statistical analysis and design of microwave circuits
4. Statistical techniques for objective characterization of microwave device statistical data
5. Broad-band determination of the FET small-signal equivalent circuit
6. Computer calculation of large signal GaAs FET amplifier characteristics
7. Statistical circuit simulation with measurement-based active device models: Implication for process control and IC manufacturability
8. A novel nonlinear statistical modeling technique for microwave devices