EM-based Monte Carlo analysis and yield prediction of microwave circuits using linear-input neural-output space mapping

IEEE Transactions on Microwave Theory and Techniques

Volumn 54, Issue 12, 2006, Pages 4528-4537

  Rayas Sánchez, José Ernesto ^a,b   Gutiérrez Ayala, Vladimir ^a,b  

^a IEEE   (Mexico)

^b Instituto Tecnologico y de Estudios Superiores de Occidente   (Mexico)

Author keywords

Computer aided design (CAD); Electromagnetic (EM) based design; EM based yield prediction; Microstrip filters; Monte Carlo analysis; Neural modeling; Space mapping; Statistical analysis; Surrogate models

Indexed keywords

MICROSTRIP FILTERS; NEURAL MODELING; SPACE MAPPING; SURROGATE MODELS; YIELD PREDICTION;

COMPUTER AIDED DESIGN; CONFORMAL MAPPING; ELECTROMAGNETIC FIELDS; MICROSTRIP DEVICES; MONTE CARLO METHODS; STATISTICAL METHODS;

MICROWAVE CIRCUITS;

EID: 33847749976     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2006.885902     Document Type: Article

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