FET statistical modeling using parameter orthogonalization

IEEE Transactions on Microwave Theory and Techniques

Volumn 44, Issue 1, 1996, Pages 47-55

  Can oil, Jim ^a   Whelan, Kerri ^a   Prichett, Sam ^a   Bridges, Daren R ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; COMPUTER SIMULATION; CORRELATION METHODS; ELECTROMAGNETIC WAVE SCATTERING; EQUIVALENT CIRCUITS; MONTE CARLO METHODS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR DEVICE MODELS; SPURIOUS SIGNAL NOISE; STATISTICAL METHODS; STATISTICAL TESTS;

NOISE PARAMETERS; PARAMETER ORTHOGONALIZATION; STANDARD DEVIATIONS; STATISTICAL MODELING;

FIELD EFFECT TRANSISTORS;

EID: 0029752316     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.481384     Document Type: Article

References (19)

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