Apertureless near-field distance-dependent lifetime imaging and spectroscopy of semiconductor nanocrystals

Journal of Physical Chemistry C

Volumn 112, Issue 42, 2008, Pages 16306-16311

  Yoskovitz, Eyal ^a   Oron, Dan ^a,b   Shweky, Itzhak ^a   Banin, Uri ^a  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

^b WEIZMANN INSTITUTE OF SCIENCE   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTIVITY; ENERGY TRANSFER; ENGINEERING GEOLOGY; FLUORESCENCE; GEOMETRICAL OPTICS; IMAGE ENHANCEMENT; LIGHT EMISSION; LUMINESCENCE; NANOCRYSTALLINE ALLOYS; NANOCRYSTALS; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTICAL CORRELATION; OPTICAL IMAGE STORAGE; OPTICAL MICROSCOPY; PLATINUM; SCANNING PROBE MICROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR MATERIALS; SILICON;

COATED TIPS; CONTRAST MECHANISMS; DIELECTRIC SURFACES; ENERGY ACCEPTORS; EXCITED PARTICLES; FLUORESCENCE INTENSITIES; FLUORESCENCE LIFETIMES; HIGH RESOLUTIONS; IMAGING MECHANISMS; LIFETIME IMAGES; LIFETIME IMAGING; MODEL PREDICTIONS; MULTIPLE EMITTERS; NEAR FIELDS; OPTICAL IMAGES; OPTICAL IMAGING; SCANNING OPTICAL MICROSCOPIES; SEMICONDUCTOR NANOCRYSTALS; SILICON TIPS; SPECTROSCOPY MEASUREMENTS; SUB DIFFRACTIONS; TOPOGRAPHY IMAGES;

MICROSCOPIC EXAMINATION;

EID: 55649107510     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp8043253     Document Type: Article

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