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Volumn 245, Issue 5, 2008, Pages 959-962

Silicon nano particles: Surface characterization, defects and electronic properties

Author keywords

[No Author keywords available]

Indexed keywords


EID: 55549137752     PISSN: 03701972     EISSN: 15213951     Source Type: Journal    
DOI: 10.1002/pssb.200743296     Document Type: Conference Paper
Times cited : (9)

References (20)
  • 18
    • 33751422518 scopus 로고    scopus 로고
    • Metrol. Meas. Syst
    • M. Pawlowski and P. Kaminski, Metrol. Meas. Syst. 11, 207 (2005).
    • (2005) , vol.11 , pp. 207
    • Pawlowski, M.1    Kaminski, P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.