Principles of microwave absorption technique applied to AgX microcrystals

Journal of Imaging Science and Technology

Volumn 41, Issue 2, 1997, Pages 118-127

  Mussig Th ^a  

^a DuPont de Nemours GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; LIGHT ABSORPTION; MATHEMATICAL MODELS; POINT DEFECTS;

MICROWAVE ABSORPTION TECHNIQUE;

PHOTOGRAPHIC EMULSIONS;

EID: 0031096298     PISSN: 10623701     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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