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Volumn 47, Issue 6 PART 2, 2008, Pages 5116-5119

Height dependence of young's modulus for carbon nanopillars grown by focused-ion-beam-induced chemical vapor deposition

(6) Nonaka, Keiichiro a,b Tamaru, Kojiro a,b Nagase, Masao a Yamaguchi, Hiroshi a Warisawa, ShiN'Ichi b Ishihara, Sunao b

a Kashino Diverse Brain Research Laboratory of NTT Communication Science Laboratories (Japan)

b UNIVERSITY OF TOKYO (Japan)

Author keywords

Carbon nanopillar; Focal point; Focused ion beam induced chemical vapor deposition; Growth rate; Resonance characteristic; Scanning electron microscope; Young's modulus

Indexed keywords

CARBON; COMMINUTION; ELASTIC MODULI; ELASTICITY; FOCUSED ION BEAMS; ION BEAMS; IONS; NATURAL FREQUENCIES; SCANNING ELECTRON MICROSCOPY; VAPORS; VIBRATIONS (MECHANICAL); WATER POLLUTION;

FOCAL POINT; FOCUSED-ION-BEAM-INDUCED CHEMICAL VAPOR DEPOSITION; RESONANCE CHARACTERISTIC; SCANNING ELECTRON MICROSCOPE; YOUNG'S MODULUS;

CHEMICAL VAPOR DEPOSITION;

EID: 55049132817 PISSN: 00214922 EISSN: 13474065 Source Type: Journal
DOI: 10.1143/JJAP.47.5116 Document Type: Article

Times cited : (7)

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