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Volumn 517, Issue 2, 2008, Pages 648-651
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Pulsed laser deposition of the yttria-stabilized zirconia films
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Author keywords
Atomic force microscopy; Nano indentation; Pulsed laser deposition; Thin film; X ray diffraction; Yttria stabilized zirconia
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ATOMIC PHYSICS;
ATOMS;
DIFFRACTION;
EXCIMER LASERS;
GAS LASERS;
KRYPTON;
LASERS;
MECHANICAL PROPERTIES;
MICROSCOPES;
MICROSCOPIC EXAMINATION;
NANOINDENTATION;
PULSED LASER APPLICATIONS;
PULSED LASER DEPOSITION;
SCANNING ELECTRON MICROSCOPY;
THICK FILMS;
X RAY ANALYSIS;
X RAY DIFFRACTION;
YTTRIUM ALLOYS;
ZIRCONIA;
AEROSPACE COMMUNITIES;
AFM IMAGES;
ATOMIC FORCE MICROSCOPES;
CHAMBER PRESSURES;
ELEMENTAL COMPOSITIONS;
FABRICATION TECHNIQUES;
KRF EXCIMER LASERS;
MORPHOLOGICAL CHARACTERISTICS;
NANOINDENTER;
OPTICAL;
PULSED LASER DEPOSITION TECHNIQUES;
PULSED LASERS;
SCANNING ELECTRON MICROSCOPES;
STABILIZED ZIRCONIAS;
STRUCTURAL CHARACTERISTICS;
X-RAY DIFFRACTIONS;
YOUNG'S MODULUS;
YSZ FILMS;
YTTRIA STABILIZED ZIRCONIA;
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EID: 55049115673
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2008.07.027 Document Type: Article |
Times cited : (6)
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References (25)
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