-
1
-
-
33644929855
-
High-temperature electronics
-
C. Lea, "High-temperature electronics," Global SMT Packag., vol. 4, no. 3, pp. 6-8, 2004.
-
(2004)
Global SMT Packag
, vol.4
, Issue.3
, pp. 6-8
-
-
Lea, C.1
-
2
-
-
7244219628
-
Liquid interconnects for fine pitch assembly
-
R. Keelere, "Liquid interconnects for fine pitch assembly," Electron. Packag. Prod. Mag., vol. 29, no. 6, pp. 14-18, 1989.
-
(1989)
Electron. Packag. Prod. Mag
, vol.29
, Issue.6
, pp. 14-18
-
-
Keelere, R.1
-
3
-
-
50049096634
-
Interconnection of a Carrier Substrate and a Semiconductor Device,
-
U.S. Patent 5 553 769
-
J. V. Ellerson, J. Funari, and J. A. Varcoe, "Interconnection of a Carrier Substrate and a Semiconductor Device," U.S. Patent 5 553 769, 1996.
-
(1996)
-
-
Ellerson, J.V.1
Funari, J.2
Varcoe, J.A.3
-
4
-
-
50049104936
-
Liquid Metal Paste for Thermal and Electrical Connections,
-
U.S. Patent 5 170 930
-
T. P. Dolbear, C. A. MacKay, and R. D. Nelson, "Liquid Metal Paste for Thermal and Electrical Connections," U.S. Patent 5 170 930, 1992.
-
(1992)
-
-
Dolbear, T.P.1
MacKay, C.A.2
Nelson, R.D.3
-
5
-
-
54849275200
-
Microelectronic Connections With Liquid Conductive Elements,
-
U.S. Patent 5 808 874
-
J. W. Smith, "Microelectronic Connections With Liquid Conductive Elements," U.S. Patent 5 808 874, 1998.
-
(1998)
-
-
Smith, J.W.1
-
6
-
-
7244231051
-
Materials and processes for implementing high-temperature liquid interconnects
-
Aug
-
S. H. Mannan and M. P. Clode, "Materials and processes for implementing high-temperature liquid interconnects," IEEE Trans. Adv. Packag., vol. 27, no. 3, pp. 508-514, Aug. 2004.
-
(2004)
IEEE Trans. Adv. Packag
, vol.27
, Issue.3
, pp. 508-514
-
-
Mannan, S.H.1
Clode, M.P.2
-
7
-
-
54849275100
-
-
M. Nowottnick, U. Pape, K. Wittke, and W. Steel, Solder joints for high-temperature electronics, in Proc. SMT4 Int. Conf., Chicago, IL, Sep.21-25, 2003, pp. 693-699.
-
M. Nowottnick, U. Pape, K. Wittke, and W. Steel, "Solder joints for high-temperature electronics," in Proc. SMT4 Int. Conf., Chicago, IL, Sep.21-25, 2003, pp. 693-699.
-
-
-
-
8
-
-
0035840417
-
Microstructure evolution in Sn-Bi and Sn-Bi-Cu solder joints under thermal aging
-
H. W. Miao and J. G. Duh, "Microstructure evolution in Sn-Bi and Sn-Bi-Cu solder joints under thermal aging," Mater. Chem. Phys., vol. 71, pp. 255-271, 2001.
-
(2001)
Mater. Chem. Phys
, vol.71
, pp. 255-271
-
-
Miao, H.W.1
Duh, J.G.2
-
9
-
-
0037076832
-
Six cases of reliability study of Pb-free solder joints in electronic packaging technology
-
K. Zeng and K. N. Tu, "Six cases of reliability study of Pb-free solder joints in electronic packaging technology," Mater. Sci. Eng. R, vol. 38, pp. 55-105, 2002.
-
(2002)
Mater. Sci. Eng. R
, vol.38
, pp. 55-105
-
-
Zeng, K.1
Tu, K.N.2
-
10
-
-
1842554859
-
Solid state interfacial reaction of Sn-37Pb and Sn-3.5Ag solders with Ni-P under bump metallization
-
M. He, Z. Chen, and G. Qi, "Solid state interfacial reaction of Sn-37Pb and Sn-3.5Ag solders with Ni-P under bump metallization," Acta Mater., vol. 52, pp. 2047-2056, 2004.
-
(2004)
Acta Mater
, vol.52
, pp. 2047-2056
-
-
He, M.1
Chen, Z.2
Qi, G.3
-
11
-
-
0001362689
-
4 scallops during interfacial reactions between liquid eutectic solders and Cu/Ni/Pd metallization
-
4 scallops during interfacial reactions between liquid eutectic solders and Cu/Ni/Pd metallization," J. Appl. Phys., vol. 88, no. 11, pp. 6887-6896, 2001.
-
(2001)
J. Appl. Phys
, vol.88
, Issue.11
, pp. 6887-6896
-
-
Ghosh, G.1
-
12
-
-
0035392017
-
Interfacial reaction and microstructural evolution for electroplated Ni and electroless Ni in the under bump metallurgy with 42Sn58Bi solder during annealing
-
B. L. Young and J. G. Duh, "Interfacial reaction and microstructural evolution for electroplated Ni and electroless Ni in the under bump metallurgy with 42Sn58Bi solder during annealing," J. Electron. Mater., vol. 30, no. 7, pp. 878-884, 2001.
-
(2001)
J. Electron. Mater
, vol.30
, Issue.7
, pp. 878-884
-
-
Young, B.L.1
Duh, J.G.2
-
13
-
-
0035426737
-
Interface reaction between copper and molten tin-lead solders
-
K. H. Prakash and T. Sritharan, "Interface reaction between copper and molten tin-lead solders," Acta Mater., vol. 49, pp. 2481-2489, 2001.
-
(2001)
Acta Mater
, vol.49
, pp. 2481-2489
-
-
Prakash, K.H.1
Sritharan, T.2
-
14
-
-
2442499428
-
Interfacial reaction and morphology between molten Sn base solder and Cu substrate
-
Takaku, X. J. Liu, I. Ohnuma, R. Kainuma, and K. Ishida, "Interfacial reaction and morphology between molten Sn base solder and Cu substrate," Mater. Trans., vol. 45, no. 3, pp. 646-651, 2004.
-
(2004)
Mater. Trans
, vol.45
, Issue.3
, pp. 646-651
-
-
Takaku, X.1
Liu, J.2
Ohnuma, I.3
Kainuma, R.4
Ishida, K.5
-
15
-
-
4344700665
-
Intermetallic compound formation between Sn-3.5Ag solder and Ni-based metallization during liquid state reaction
-
M. He, W. H. Lau, G. Qi, and Z. Chen, "Intermetallic compound formation between Sn-3.5Ag solder and Ni-based metallization during liquid state reaction," Thin Solid Films, vol. 462-463, pp. 376-383, 2004.
-
(2004)
Thin Solid Films
, vol.462-463
, pp. 376-383
-
-
He, M.1
Lau, W.H.2
Qi, G.3
Chen, Z.4
-
16
-
-
54849275000
-
-
J. F. Li, S. H. Mannan, M. P. Clode, C. Q. Liu, K. M. Chen, D. C. Whalley, D. A. Hutt, and P. P. Conway, Molten solder interconnects I: Evaluation of Sn-Bi-X/Cu systems and failure mechanisms of LGA assemblies, in Proc. HITEN'05 Int. Conf., Paris, France, Sep. 6-8 2005, [CD ROM].
-
J. F. Li, S. H. Mannan, M. P. Clode, C. Q. Liu, K. M. Chen, D. C. Whalley, D. A. Hutt, and P. P. Conway, "Molten solder interconnects I: Evaluation of Sn-Bi-X/Cu systems and failure mechanisms of LGA assemblies," in Proc. HITEN'05 Int. Conf., Paris, France, Sep. 6-8 2005, [CD ROM].
-
-
-
-
17
-
-
0032096253
-
Microstrucrural index to quantify thermal spray deposit microstructures using image analysis
-
G. Montavon, C. Coddet, C. C. Berndt, and S.-H. Leigh, "Microstrucrural index to quantify thermal spray deposit microstructures using image analysis," J. Therm. Spray Technol., vol. 7, no. 2, pp. 229-241, 1998.
-
(1998)
J. Therm. Spray Technol
, vol.7
, Issue.2
, pp. 229-241
-
-
Montavon, G.1
Coddet, C.2
Berndt, C.C.3
Leigh, S.-H.4
-
18
-
-
0000072496
-
Kinetic analysis of the soldering reaction between eutectic SnPb alloy and Cu accompanied by ripening
-
H. K. Kim and K. N. Tu, "Kinetic analysis of the soldering reaction between eutectic SnPb alloy and Cu accompanied by ripening," Phys. Rev. B, vol. 53, pp. 16027-16034, 1996.
-
(1996)
Phys. Rev. B
, vol.53
, pp. 16027-16034
-
-
Kim, H.K.1
Tu, K.N.2
-
19
-
-
0032095232
-
A thermodynamic study of Ru-Sn binary alloys
-
R. Kawabata, M. M. Chin, and M. Iwase, "A thermodynamic study of Ru-Sn binary alloys," Metallurgical Mater. Trans. B, vol. 29B, pp. 577-581, 1998.
-
(1998)
Metallurgical Mater. Trans. B
, vol.29 B
, pp. 577-581
-
-
Kawabata, R.1
Chin, M.M.2
Iwase, M.3
-
20
-
-
54849274900
-
-
Singapore Institute of Manufacturing Technology Simtech, Singapore, Online, Available
-
Q. F. Li, S. X. Zhang, M. K. Ho, S. F. Pock, and J. M. S. Yong, "Semi-solid metal powder forming of Ti-Sn alloys & their metal matrix composites," Singapore Institute of Manufacturing Technology (Simtech), Singapore, 2008 [Online]. Available: http://www.simtech. a-star.edu.sg/Research/Technical-Reports/FR04FT07.pdf
-
(2008)
Semi-solid metal powder forming of Ti-Sn alloys & their metal matrix composites
-
-
Li, Q.F.1
Zhang, S.X.2
Ho, M.K.3
Pock, S.F.4
Yong, J.M.S.5
-
21
-
-
0037237037
-
Prevention of spalling by the self-formed reaction barrier layer on controlled collapse chip connections under bump metallization
-
C. Y. Liu and S. J. Wang, "Prevention of spalling by the self-formed reaction barrier layer on controlled collapse chip connections under bump metallization," J. Electron. Mater., vol. 32, no. 1, pp. L1-L3, 2003.
-
(2003)
J. Electron. Mater
, vol.32
, Issue.1
-
-
Liu, C.Y.1
Wang, S.J.2
-
22
-
-
0032614004
-
Solder reaction-assisted crystallization of electroless Ni-P under bump metalization in low cost flip chip technology
-
J. W. Jang, P. G. Kim, K. N. Tu, D. R. Frear, and P. Tbompson, "Solder reaction-assisted crystallization of electroless Ni-P under bump metalization in low cost flip chip technology," J. Appl. Phys., vol. 85, no. 12, pp. 8456-8463, 1999.
-
(1999)
J. Appl. Phys
, vol.85
, Issue.12
, pp. 8456-8463
-
-
Jang, J.W.1
Kim, P.G.2
Tu, K.N.3
Frear, D.R.4
Tbompson, P.5
-
23
-
-
0037461191
-
Effect of plating parameters on the intrinsic stress in electroless nickel plating
-
Z. Chen, X. Xu, C. C. Wong, and S. Mhaisalkar, "Effect of plating parameters on the intrinsic stress in electroless nickel plating," Surf. Coatings Technol., vol. 167, pp. 170-176, 2003.
-
(2003)
Surf. Coatings Technol
, vol.167
, pp. 170-176
-
-
Chen, Z.1
Xu, X.2
Wong, C.C.3
Mhaisalkar, S.4
-
24
-
-
0035691289
-
Methodology for studying the impact of intrinsic stress on the reliability of the electroless Ni UBM structure
-
Dec
-
D. Mitchell, Y. Guo, and V. Sarihan, "Methodology for studying the impact of intrinsic stress on the reliability of the electroless Ni UBM structure," IEEE Trans. Compon. Packag. Technol., vol. 24, no. 4, pp. 667-672, Dec. 2001.
-
(2001)
IEEE Trans. Compon. Packag. Technol
, vol.24
, Issue.4
, pp. 667-672
-
-
Mitchell, D.1
Guo, Y.2
Sarihan, V.3
-
25
-
-
33845416872
-
Comparison of interfacial reactions of Ni and Ni-P in extended contact with liquid Sn-Bi-based solders
-
J. F. Li, S. H. Sainjid, M. P. Clode, K. Chen, D. C. Whalley, C. Liu, and D. A. Hutt, "Comparison of interfacial reactions of Ni and Ni-P in extended contact with liquid Sn-Bi-based solders," Acta Mater., vol. 55, pp. 737-752, 2007.
-
(2007)
Acta Mater
, vol.55
, pp. 737-752
-
-
Li, J.F.1
Sainjid, S.H.2
Clode, M.P.3
Chen, K.4
Whalley, D.C.5
Liu, C.6
Hutt, D.A.7
-
26
-
-
15544371362
-
Intermetallic compounds growth between Sn-3.5Ag lead-free solder and Cu substrate by dipping method
-
D. Q. Yu, C. M. L. Wu, C. M. T. Law, L. Wang, and J. K. L. Lai, "Intermetallic compounds growth between Sn-3.5Ag lead-free solder and Cu substrate by dipping method," J. Alloy Compounds, vol. 392, pp. 192-199, 2005.
-
(2005)
J. Alloy Compounds
, vol.392
, pp. 192-199
-
-
Yu, D.Q.1
Wu, C.M.L.2
Law, C.M.T.3
Wang, L.4
Lai, J.K.L.5
-
27
-
-
0031139581
-
Prediction of interface reaction products between Cu and various solder alloys by thermodynamic calculation
-
B. J. Lee, N. M. Hwang, and H. M. Lee, "Prediction of interface reaction products between Cu and various solder alloys by thermodynamic calculation," Acta Mater., vol. 45, pp. 1867-1874, 1997.
-
(1997)
Acta Mater
, vol.45
, pp. 1867-1874
-
-
Lee, B.J.1
Hwang, N.M.2
Lee, H.M.3
-
28
-
-
9544252973
-
Analyses of interfacial reactions at different levels of interconnection
-
T. Laurila, V. Vuorinen, and J. K. Kivilahti, "Analyses of interfacial reactions at different levels of interconnection," Mater. Sci. Semicond. Process., vol. 7, pp. 307-317, 2004.
-
(2004)
Mater. Sci. Semicond. Process
, vol.7
, pp. 307-317
-
-
Laurila, T.1
Vuorinen, V.2
Kivilahti, J.K.3
|