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Volumn 71, Issue 3, 2001, Pages 255-271
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Microstructure evolution in Sn-Bi and Sn-Bi-Cu solder joints under thermal aging
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Author keywords
Interfacial morphology; Intermetallic compound; Microstructure; Solder; Thermal aging
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Indexed keywords
AGING OF MATERIALS;
BINARY ALLOYS;
COPPER ALLOYS;
EUTECTICS;
INTERFACES (MATERIALS);
INTERMETALLICS;
METALLIZING;
METALLOGRAPHIC MICROSTRUCTURE;
MORPHOLOGY;
SILVER ALLOYS;
TERNARY SYSTEMS;
TIN ALLOYS;
COARSENING;
INTERFACIAL MORPHOLOGY;
SOLDERED JOINTS;
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EID: 0035840417
PISSN: 02540584
EISSN: None
Source Type: Journal
DOI: 10.1016/S0254-0584(01)00298-X Document Type: Article |
Times cited : (154)
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References (32)
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