Optical and electrical characterization of sputter-deposited FeSi 2 and its evolution with annealing temperature

Journal of Applied Physics

Volumn 104, Issue 6, 2008, Pages

  Tan, K H ^a,b   Chi, D Z ^b   Pey, K L ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^b INSTITUTE OF MATERIALS RESEARCH AND ENGINEERING   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 54749136657     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2981198     Document Type: Article

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