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Review of Scientific Instruments

Volumn 79, Issue 9, 2008, Pages

A compact UHV deposition system for in situ study of ultrathin films via hard x-ray scattering and spectroscopy

(4) Couet, Sebastien a Diederich, Thomas a Schlage, Kai a Röhlsberger, Ralf a

a DESY (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 54749128226 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.2982059 Document Type: Article

Times cited : (24)

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