Improved self-absorption correction for fluorescence measurements of extended x-ray absorption fine-structure

Physica Scripta T

Volumn T115, Issue , 2005, Pages 202-204

  Booth, C H ^a   Bridges, F ^b  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; PHOTONS; THICKNESS CONTROL;

AMPLITUDE REDUCTION; EXAFS OSCILLATIONS; FLUORESCENCE MEASUREMENTS; SELF ABSORPTION CORRECTION;

FLUORESCENCE;

EID: 34247482757     PISSN: 02811847     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1238/Physica.Topical.115a00202     Document Type: Article

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