Statistical simulations for Flash memory reliability analysis and prediction

IEEE Transactions on Electron Devices

Volumn 51, Issue 10, 2004, Pages 1636-1643

  Larcher, Luca ^a   Pavan, Paolo ^a  

^a UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CORRELATION METHODS; LEAKAGE CURRENTS; MATHEMATICAL MODELS; RELIABILITY THEORY; SEMICONDUCTOR STORAGE; STATISTICAL METHODS; THRESHOLD VOLTAGE;

DEVICE SIMULATIONS; SEMICONDUCTOR DEVICE RELIABILITY; SEMICONDUCTOR MEMORIES; STRESS INDUCED LEAKAGE CURRENT;

FLASH MEMORY;

EID: 5444274648     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2004.835023     Document Type: Article

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