Polychromatic microdiffraction characterization of defect gradients in severely deformed materials

Micron

Volumn 40, Issue 1, 2009, Pages 28-36

  Barabash, Rozaliya I ^a,b   Ice, Gene E ^a   Liu, Wenjun ^c   Barabash, Oleg M ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF TENNESSEE   (United States)

^c ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

Severe plastic deformation; Three dimensional microscopy; Three dimensional reconstruction; X ray microdiffraction

Indexed keywords

ABS RESINS; CRYSTAL STRUCTURE; DEFORMATION; DIFFRACTION; DISLOCATIONS (CRYSTALS); SURFACE STRUCTURE; TITANIUM; X RAY DIFFRACTION;

COMPLEX MATERIALS; FRICTION STIR WELDING; GEOMETRICALLY NECESSARY DISLOCATIONS; LOCAL LATTICES; LOCAL STRUCTURES; MICRODIFFRACTION; NONDESTRUCTIVE; POLYCRYSTALLINE TITANIUMS; SEVERE PLASTIC DEFORMATION; SPATIALLY RESOLVED; THREE-DIMENSIONAL MICROSCOPY; THREE-DIMENSIONAL RECONSTRUCTION; X-RAY MICRODIFFRACTION;

THREE DIMENSIONAL;

EID: 54349097535     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2008.03.010     Document Type: Article

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