Electric property control of carbon nanotubes by defects

Japanese Journal of Applied Physics

Volumn 47, Issue 4 PART 2, 2008, Pages 3292-3295

  Suzuki, Satoru ^a   Hashimoto, Jun Ichi ^a,b   Ogino, Toshio ^b   Kobayashi, Yoshihiro ^a  

^a Bio Medical Informatics Research Center   (Japan)

^b YOKOHAMA NATIONAL UNIVERSITY   (Japan)

Author keywords

Barrier; FET; Low energy irradiation damage; SET; Single walled carbon nanotubes

Indexed keywords

CARBON; ELECTRIC PROPERTIES; ELECTRIC VARIABLES MEASUREMENT; ELECTRON BEAM LITHOGRAPHY; ELECTRON BEAMS; ELECTRON IRRADIATION; IRRADIATION; NANOCOMPOSITES; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; NANOTUBES; SINGLE-WALLED CARBON NANOTUBES (SWCN);

BARRIER; FET; LOW-ENERGY IRRADIATION DAMAGE; SET; SINGLE-WALLED CARBON NANOTUBES;

CARBON NANOTUBES;

EID: 54249151888     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.47.3292     Document Type: Article

References (17)

1. S. Suzuki, K. Kanzaki, Y. Homma, and S. Fukuba: Jpn. J. Appl. Phys. 43 (2004) L1118.
2. S. Suzuki, D. Takagi, Y. Homma, and Y. Kobayashi: Jpn. J. Appl. Phys. 44 (2005) L133.
3. S. Suzuki and Y. Kobayashi: Chem. Phys. Lett. 430 (2006) 370.
4. S. Suzuki and Y. Kobayashi: J. Phys. Chem. C 111 (2007) 4524.
5. S. Suzuki and Y. Kobayashi: Mater. Res. Soc. Symp. Proc. 994 (2007) F04-02.
6. A. Vijayaraghavan, K. Kanzaki, S. Suzuki, Y. Kobayashi. H. Inokawa, Y. Ono. S. Kar, and P. M. Ajayan: Nano Lett. 5 (2005) 1575.
7. S. Suzuki and Y. Kobayashi: Jpn. J. Appl. Phys. 44 (2005) L1498.
8. T. D. Yuzvinsky, A. M. Fennimore, W. Mickelson, C. Esquivias, and A. Zettl: Appl. Phys. Lett. 86 (2005) 053109.
9. K. Matsumoto. S. Kinoshita, Y. Gotoh. K. Kurachi, T. Kamimura, M. Maeda, K. Sakamoto, M. Kuwahara, N. Atoda, and Y. Awano: Jpn. J. Appl. Phys. 42 (2003) 2415.
10. T. Kamimura, K. Yamamoto, and K. Matsumoto: Jpn. J. Appl. Phys. 43 (2004) 2271.
11. T. Kamimura, M. Maeda, K. Sakamoto, and K. Matsumoto: Jpn. J. Appl. Phys. 44 (2005) 461.
12. Y. Gotoh, K. Matsumoto, and T. Maeda: Jpn. J. Appl. Phys. 41 (2002) 2578.
13. K. Kanzaki, S. Suzuki, H. Inokawa, Y. Ono, A. Vijayaraghavan, and Y. Kobayashi: J. Appl. Phys. 101 (2007) 034317.
14. B.-H. Chen, J.-H. Wei, P.-Y. Lo, Z.-W. Pei, T.-S. Chao, H.-C. Lin, and T.-Y. Huang: Jpn. J. Appl. Phys. 45 (2006) 3680.
15. J.-Y. Park: Appl. Phys. Lett. 90 (2007) 023112.
16. Y. Li, D. Mann, M. Rolandi, W. Kim, A. Ural, S. Hung, A. Javey, J. Cao, D. Wang, E. Yenilmez, Q. Wang, J. F. Gibbons, Y. Nishi, and H. Dai: Nano Lett. 4 (2004) 317.
17. H. Ohnaka, Y. Kojima, S. Kishimoto, Y. Ohno, and T. Mizutani: Jpn. J. Appl. Phys. 45 (2006) 5485.