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Volumn 177, Issue 1-3, 2007, Pages 89-95

Temperature dependence of the electric field gradient in GaN measured with the PAC-probe 181Hf

Author keywords

GaN; Implantation; Nitrides; Perturbed angular correlation

Indexed keywords


EID: 54249114895     PISSN: 03043843     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10751-008-9708-7     Document Type: Article
Times cited : (4)

References (16)
  • 1
    • 0003987639 scopus 로고    scopus 로고
    • Gil, B. (ed.): Series on Semiconductor Science and Technology 6. Oxford Science Publications, Oxford
    • Gil, B. (ed.): In: Group III Nitride Semiconductor Compounds, Physics and Applications; Series on Semiconductor Science and Technology 6. Oxford Science Publications, Oxford (1998)
    • (1998) Group III Nitride Semiconductor Compounds, Physics and Applications
  • 6
    • 54249151187 scopus 로고    scopus 로고
    • PhD thesis, University of Bonn, Germany
    • Nédléc, R.: PhD thesis, University of Bonn, Germany (2007)
    • (2007)
    • Nédléc, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.