Direct imaging of the structural change generated by dielectric breakdown in MgO based magnetic tunnel junctions

Applied Physics Letters

Volumn 93, Issue 15, 2008, Pages

  Thomas, A ^a   Drewello, V ^a   Schafers M ^a   Weddemann, A ^a   Reiss, G ^a   Eilers, G ^b   Munzenberg M ^b   Thiel, K ^b   Seibt, M ^b  

^a BIELEFELD UNIVERSITY   (Germany)

^b UNIVERSITY OF GÖTTINGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC BREAKDOWN; ION BOMBARDMENT; MAGNETIC DEVICES; MICROSCOPIC EXAMINATION; SEMICONDUCTOR JUNCTIONS; TUNNELS; WAVEGUIDE JUNCTIONS;

DIELECTRIC BREAKDOWNS; DIRECT IMAGING; MAGNETIC TUNNEL JUNCTIONS; PINHOLE FORMATIONS; STRUCTURAL CHANGES; TRANSMISSION ELECTRON MICROSCOPY MEASUREMENTS; TRANSPORT BEHAVIORS;

TUNNEL JUNCTIONS;

EID: 54149087331     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3001934     Document Type: Article

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