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Volumn 101, Issue 1, 2007, Pages

Transmission electron microscopy study on the polycrystalline CoFeBMgOCoFeB based magnetic tunnel junction showing a high tunneling magnetoresistance, predicted in single crystal magnetic tunnel junction

(4) Choi, Y S a Tsunekawa, K a Nagamine, Y a Djayaprawira, D a

a Canon ANELVA Technix Corporation (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

MAGNETORESISTANCE; POLYCRYSTALLINE MATERIALS; SINGLE CRYSTALS; TEXTURES; TRANSMISSION ELECTRON MICROSCOPY; TUNNEL JUNCTIONS;

CRYSTALLINITY; HIGH TUNNELING MAGNETORESISTANCE; MAGNETIC TUNNEL JUNCTIONS; TUNNEL BARRIERS;

COBALT COMPOUNDS;

EID: 33846311759 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.2407270 Document Type: Article

Times cited : (65)

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