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Volumn 19, Issue SUPPL. 1, 2008, Pages

Investigation of defects in Cu(In,Ga)(S,Se) 2 films using the photocurrent decay technique

Author keywords

[No Author keywords available]

Indexed keywords

CU(IN ,GA)(S ,SE)2; PHOTO-INDUCED CURRENT;

EID: 53649109141     PISSN: 09574522     EISSN: 1573482X     Source Type: Journal    
DOI: 10.1007/s10854-008-9593-5     Document Type: Article
Times cited : (5)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.