Test procedures for proton-induced single event latchup in space environments

IEEE Transactions on Nuclear Science

Volumn 55, Issue 4, 2008, Pages 2161-2165

  Felix, James A ^a   Schwank, James R ^a   Shaneyfelt, Marty R ^a   Baggio, Jacques ^b   Paillet, Philippe ^b   Ferlet Cavrois, Veronique ^b   Dodd, Paul E ^a   Girard, Sylvain ^b   Blackmore, Ewart W ^c  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b CEA DIF   (France)

^c TRIUMF   (Canada)

Author keywords

COTS; Hardness assurance; Proton; Radiation effects; SEU; Single event; Single event latchup (SEL); SRAM

Indexed keywords

ELECTRIC POWER PLANTS; HARDNESS; IRRADIATION; PROTONS; STATIC RANDOM ACCESS STORAGE;

COTS; HARDNESS ASSURANCE; PROTON; RADIATION EFFECTS; SEU; SINGLE EVENT; SINGLE-EVENT LATCHUP (SEL); SRAM;

PROTON IRRADIATION;

EID: 53349108795     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2008.2000773     Document Type: Conference Paper

References (8)

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