New strain measurement method at axial tensile test of thin films through direct imaging

Journal of Physics D: Applied Physics

Volumn 41, Issue 17, 2008, Pages

  Ha, Jong Eun ^a   Park, Jun Hyub ^b   Kang, Dong Joong ^c  

^a Seoul National University of Science and Technology   (South Korea)

^b Tongmyong University   (South Korea)

^c Pusan National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITE MICROMECHANICS; ELECTROMECHANICAL DEVICES; MEMS; MICROELECTROMECHANICAL DEVICES; SENSOR NETWORKS; STRAIN GAGES; STRAIN MEASUREMENT; TENSILE TESTING; TESTING; THICK FILMS; THICKNESS MEASUREMENT; THIN FILMS;

DIRECT IMAGING; DISPLACEMENT MEASUREMENTS; DISPLACEMENT SENSORS; EDGE PROJECTION; GAUGE LENGTHS; HORIZONTAL DIRECTION; IMAGE-BASED; IN-SITU MEASUREMENTS; MEASUREMENT METHODS; MEASUREMENT SYSTEMS; MEMS DEVICES; MICRO SCALES; MICRO-ELECTRO- MECHANICAL SYSTEM; NON-CONTACT; REGION -OF-INTEREST; SHAPE INDICATORS;

ELECTRONIC EQUIPMENT TESTING;

EID: 53249107977     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/41/17/175406     Document Type: Article

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