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Volumn , Issue , 2007, Pages 309-312
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Low-temperature MEMS process using plasma activated Silicon-On-Silicon (SOS) bonding
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Author keywords
[No Author keywords available]
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Indexed keywords
ASPECT RATIO;
COMPOSITE MICROMECHANICS;
DIELECTRIC DEVICES;
FABRICATION;
MECHANICAL ENGINEERING;
MECHANICS;
MECHATRONICS;
MEMS;
MICROELECTROMECHANICAL DEVICES;
NONMETALS;
OPTICAL DESIGN;
PLASMAS;
REACTIVE ION ETCHING;
SEMICONDUCTOR SWITCHES;
SILICA;
SILICON COMPOUNDS;
SURFACE TREATMENT;
WAFER BONDING;
DIELECTRIC-BARRIER-DISCHARGE;
ETCH PROFILE;
HIGH ASPECT RATIOS;
INTERNATIONAL CONFERENCES;
LOW TEMPERATURES;
LOW-TEMPERATURE WAFER BONDING;
MEMS DEVICES;
MEMS PROCESS;
MEMS TECHNOLOGY;
MICRO-ELECTRO MECHANICAL SYSTEMS;
OPTIMAL BONDING;
SILICON DIOXIDE LAYERS;
SILICON-ON -INSULATOR;
SILICON-ON-GLASS;
SILICON-ON-SILICON;
TREATMENT PROCESSES;
SILICON WAFERS;
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EID: 52249104878
PISSN: 10846999
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (4)
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References (8)
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