Characterization of optical properties of nanocrystalline doped PZT thin films

Journal of the European Ceramic Society

Volumn 25, Issue 12 SPEC. ISS., 2005, Pages 2273-2276

  Lappalainen, Jyrki ^a   Hiltunen, Jussi ^b   Lantto, Vilho ^a  

^a UNIVERSITY OF OULU   (Finland)

^b VTT TECHNICAL RESEARCH CENTRE OF FINLAND   (Finland)

Author keywords

Electro optics; Films; Grain size; Optical properties; PZT

Indexed keywords

CRYSTAL STRUCTURE; DOPING (ADDITIVES); ELLIPSOMETRY; GRAIN SIZE AND SHAPE; KERR ELECTROOPTICAL EFFECT; LIGHT REFRACTION; NANOSTRUCTURED MATERIALS; PULSED LASER DEPOSITION; REFRACTIVE INDEX; X RAY DIFFRACTION ANALYSIS;

OPTICAL APPLICATIONS; OPTICAL THIN FILM FABRICATION; OPTICAL TRANSMISSION SPECTRA; POLYCRYSTALLINE FILMS;

FERROELECTRIC THIN FILMS;

CERAMICS;

EID: 20444451251     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2005.03.044     Document Type: Article

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