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Volumn 330, Issue 2, 1998, Pages 183-189

Thickness dependence of structural and ferroelectric properties of sol-gel Pb(Zr0.56Ti0.44)0.90(Mg1/3Nb 2/3)0.10O3 films

Author keywords

Ferroelectric properties; Interfaces; Structural properties; Transmission electron microscopy

Indexed keywords

CRYSTAL ORIENTATION; ELECTRODES; FERROELECTRIC MATERIALS; FILM PREPARATION; GRAIN SIZE AND SHAPE; INTERFACES (MATERIALS); MULTILAYERS; PERMITTIVITY; PEROVSKITE; SOL-GELS; SPUTTER DEPOSITION; TEXTURES;

EID: 0032157933     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)00574-4     Document Type: Article
Times cited : (18)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.