Automatic inline defect detection for a thin film transistor-liquid crystal display array process using locally linear embedding and support vector data description

Measurement Science and Technology

Volumn 19, Issue 9, 2008, Pages

  Liu, Yi Hung ^a   Huang, Yu Kai ^a   Lee, Ming Jiu ^a,b  

^a CHUNG YUAN CHRISTIAN UNIVERSITY   (Taiwan)

^b CHUNGHWA PICTURE TUBES LTD   (Taiwan)

Author keywords

Defect detection; Locally linear embedding; Manifold learning; One class classification; Support vector data description; Thin film transistor liquid crystal display

Indexed keywords

CRYSTAL DEFECTS; DATA DESCRIPTION; DECISION MAKING; DEFECTS; IMAGE SEGMENTATION; LIQUID CRYSTAL DISPLAYS; LIQUIDS; MANUFACTURE; PIXELS; THIN FILM CIRCUITS; THIN FILMS;

DEFECT DETECTION; LOCALLY LINEAR EMBEDDING; MANIFOLD LEARNING; ONE-CLASS CLASSIFICATION; SUPPORT VECTOR DATA DESCRIPTION; THIN FILM TRANSISTOR LIQUID CRYSTAL DISPLAYS;

THIN FILM TRANSISTORS;

EID: 51549110785     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/19/9/095501     Document Type: Article

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