Automatic TFT-LCD mura defect inspection using discrete cosine transform-based background filtering and 'just noticeable difference' quantification strategies

Measurement Science and Technology

Volumn 19, Issue 1, 2008, Pages

  Chen, Liang Chia ^a   Kuo, Chia Cheng ^a  

^a NATIONAL TAIPEI UNIVERSITY OF TECHNOLOGY   (Taiwan)

Author keywords

Automatic optical inspection (AOI); Defect inspection; Discrete cosine transform (DCT); Mura defects; TFT LCD

Indexed keywords

ALGORITHMS; FILTRATION; FLAT PANEL DISPLAYS; LIQUID CRYSTAL DISPLAYS; SURFACE DEFECTS; THIN FILM TRANSISTORS;

AUTOMATIC OPTICAL INSPECTION (AOI); DEFECT INSPECTION; MURA DEFECTS;

DISCRETE COSINE TRANSFORMS;

ALGORITHMS; DISCRETE COSINE TRANSFORMS; FILTRATION; FLAT PANEL DISPLAYS; LIQUID CRYSTAL DISPLAYS; SURFACE DEFECTS; THIN FILM TRANSISTORS;

EID: 38849172631     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/19/1/015507     Document Type: Article

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