-
1
-
-
0025461953
-
Experimental determination of interfacial toughness curves using Brazil-nut-sandwiches
-
Wang J. S. and, Suo Z., "Experimental determination of interfacial toughness curves using Brazil-nut-sandwiches", 1990, Acta Met., vol. 38, pp 1279-1290.
-
(1990)
Acta Met
, vol.38
, pp. 1279-1290
-
-
Wang, J.S.1
Suo, Z.2
-
2
-
-
0346550201
-
Split singularities: Stress field near the edge of a silicon die on a polymer substrate
-
Liu, X.H., Suo, Z. and Ma, Q., "Split singularities: stress field near the edge of a silicon die on a polymer substrate", Acta Mater. 47(1): 67-76, (1999).
-
(1999)
Acta Mater
, vol.47
, Issue.1
, pp. 67-76
-
-
Liu, X.H.1
Suo, Z.2
Ma, Q.3
-
3
-
-
33947668356
-
Split singularities and the competition between crack penetration and debond at a bimaterial interface
-
Zhang Z., and Suo Z., "Split singularities and the competition between crack penetration and debond at a bimaterial interface", Int. J. Solids Struct. 44(13), 4559-4573 (2007).
-
(2007)
Int. J. Solids Struct
, vol.44
, Issue.13
, pp. 4559-4573
-
-
Zhang, Z.1
Suo, Z.2
-
4
-
-
2342512828
-
-
Zhai CJ, Sidharth, Blish RC, and Master R.N, Investigation and minimization of underfill delamination in flip chip packages, IEEE Trans. Device Mater. Reliability 4(1): 86-91, (2004).
-
Zhai CJ, Sidharth, Blish RC, and Master R.N, "Investigation and minimization of underfill delamination in flip chip packages", IEEE Trans. Device Mater. Reliability 4(1): 86-91, (2004).
-
-
-
-
5
-
-
0037245941
-
Critical aspects of high-performance microprocessor packaging
-
Atluri, V.P., et al., "Critical aspects of high-performance microprocessor packaging", MRS Bulletin 28(1): 21-34, (2003).
-
(2003)
MRS Bulletin
, vol.28
, Issue.1
, pp. 21-34
-
-
Atluri, V.P.1
-
6
-
-
0035248513
-
The effects of underfill and its material models on thermomechanical behaviors of a flip chip package
-
Chen, L, Zhang, Q, Wang, G.Z., et al. "The effects of underfill and its material models on thermomechanical behaviors of a flip chip package", IEEE Transactions on Advanced Packaging 24(1): 17-24, (2001).
-
(2001)
IEEE Transactions on Advanced Packaging
, vol.24
, Issue.1
, pp. 17-24
-
-
Chen, L.1
Zhang, Q.2
Wang, G.Z.3
-
7
-
-
0035280091
-
Investigation of the underfill delamination and cracking in flip-chip modules under temperature cyclic loading
-
Fan X.J., Wang H.B., Lim T.B., "Investigation of the underfill delamination and cracking in flip-chip modules under temperature cyclic loading", IEEE Trans. Components Packaging Tech. 24(1): 84-91, (2001).
-
(2001)
IEEE Trans. Components Packaging Tech
, vol.24
, Issue.1
, pp. 84-91
-
-
Fan, X.J.1
Wang, H.B.2
Lim, T.B.3
-
8
-
-
0036665640
-
Mechanical fatigue test method for chip/underfill delamination in flip-chip packages
-
Hirohata K., et al., "Mechanical fatigue test method for chip/underfill delamination in flip-chip packages", IEEE Trans. Electronics Packaging Manuf. 25(3): 217-222, (2002).
-
(2002)
IEEE Trans. Electronics Packaging Manuf
, vol.25
, Issue.3
, pp. 217-222
-
-
Hirohata, K.1
-
9
-
-
33846550040
-
Delamination in patterned films
-
Liu X.H., Lane, M.W., Shaw, T.M, and Simonyi, E., "Delamination in patterned films", Int. J. Solids Struct. 44(6): 1706-1718, (2007
-
(2007)
Int. J. Solids Struct
, vol.44
, Issue.6
, pp. 1706-1718
-
-
Liu, X.H.1
Lane, M.W.2
Shaw, T.M.3
Simonyi, E.4
-
10
-
-
0032291670
-
The effect of underfill and underfill delamination on the thermal stress in flip-chip solder joints
-
Rzepka S, Korhonen MA, Meusel E, et al., "The effect of underfill and underfill delamination on the thermal stress in flip-chip solder joints", J. Electronic Packaging 120 (4): 342-348, (1998).
-
(1998)
J. Electronic Packaging
, vol.120
, Issue.4
, pp. 342-348
-
-
Rzepka, S.1
Korhonen, M.A.2
Meusel, E.3
-
11
-
-
0032035701
-
Flip chip package failure mechanism
-
Semmens, J.E. and Adams, T., "Flip chip package failure mechanism", Solid State Technology 41(4): 59-64, (1998).
-
(1998)
Solid State Technology
, vol.41
, Issue.4
, pp. 59-64
-
-
Semmens, J.E.1
Adams, T.2
-
12
-
-
0026122775
-
Enhancement of flip-chip fatigue life by encapsulation
-
Suryanarayana D, Hsiao R, Gall TP, et al., "Enhancement of flip-chip fatigue life by encapsulation", IEEE Trans. Components, Hybrids, & Manuf. Tech. 14(1): 218-223, (1991).
-
(1991)
IEEE Trans. Components, Hybrids, & Manuf. Tech
, vol.14
, Issue.1
, pp. 218-223
-
-
Suryanarayana, D.1
Hsiao, R.2
Gall, T.P.3
|