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Thin Solid Films

Volumn 516, Issue 23, 2008, Pages 8244-8247

Hydrothermal growth and characterization of ZnO thin film on sapphire (0001) substrate with p-GaN buffer layer

(7) Sahoo, Trilochan a Jeon, Ju Won a Kannan, V a Lee, Cheul Ro a Yu, Yeon Tae a Song, Yong Won b Lee, In Hwan a

a Chonbuk National University (South Korea)

b Korea Polytechnic University (South Korea)

Author keywords

Epitaxy; Hydrothermal deposition; p type gallium nitride; Photoluminescence; Thin films; X ray diffraction; Zinc oxide

Indexed keywords

AMMONIUM COMPOUNDS; AMORPHOUS MATERIALS; BUFFER LAYERS; CORUNDUM; FILM GROWTH; GALLIUM ALLOYS; GALLIUM NITRIDE; IMAGING TECHNIQUES; METALLIC FILMS; NITRATES; OPTICAL FILMS; OPTICAL MICROSCOPY; OPTICAL PROPERTIES; OPTICAL WAVEGUIDES; SEMICONDUCTING CADMIUM TELLURIDE; SEMICONDUCTING GALLIUM; SEMICONDUCTING ZINC COMPOUNDS; SOLIDS; SOLUTIONS; SUBSTRATES; THICK FILMS; THIN FILMS; VAPOR DEPOSITION; X RAY DIFFRACTION ANALYSIS; ZINC; ZINC ALLOYS; ZINC OXIDE; ZINC SULFIDE;

AMMONIUM HYDROXIDES; AQUEOUS SOLUTIONS; C -AXIS; EPITAXIAL RELATIONSHIPS; EPITAXY; GAN/SAPPHIRE; HYDROTHERMAL DEPOSITION; HYDROTHERMAL GROWTH; HYDROTHERMAL TECHNIQUES; MONOCRYSTALLINE; P-TYPE GALLIUM NITRIDE; PHOTOLUMINESCENCE; ROOM-TEMPERATURE PHOTOLUMINESCENCE; SINGLE-CRYSTALLINE; SINGLE-STEP; WURTZITE; X-RAY DIFFRACTION; ZINC NITRATES; ZNO FILMS; ZNO THIN FILMS;

MOLECULAR BEAM EPITAXY;

EID: 50849085163 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2008.03.001 Document Type: Article

Times cited : (15)

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