Advanced low-noise X-ray readout ASIC for radiation sensor interfaces

IEEE Transactions on Circuits and Systems I: Regular Papers

Volumn 55, Issue 7, 2008, Pages 1854-1862

  Noulis, Thomas ^a   Siskos, Stylianos ^a   Sarrabayrouse, Gérard ^b   Bary, Laurent ^b  

^a ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

^b UNIVERSITÉ DE TOULOUSE   (France)

Author keywords

CMOS; Low noise; Operational transconductance amplifiers (OTAs); Radiation detection; Readout front end

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; CAPACITANCE; CMOS INTEGRATED CIRCUITS; INTEGRATED CIRCUIT DESIGN; OPERATIONAL AMPLIFIERS; PULSE SHAPING; SILICON DETECTORS; TRANSCONDUCTANCE;

EQUIVALENT NOISE CHARGES; FRONT END; FRONT END ARCHITECTURE; IMPLEMENTATION TECHNIQUES; LOW NOISE; PERFORMANCE CHARACTERISTICS; RADIATION DETECTION; TRANSCONDUCTOR CIRCUITS;

X RAY DETECTORS;

EID: 50549097142     PISSN: 10577122     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCSI.2008.916627     Document Type: Article

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