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Volumn , Issue , 2006, Pages 173-176

Programmable OTA based CMOS shaping amplifier for X-rays spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; SILICON; TRANSCONDUCTANCE; X RAY SPECTROSCOPY;

EID: 34547257021     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (12)

References (12)
  • 1
    • 0032099860 scopus 로고    scopus 로고
    • XPS: A multi-channel preamplifier-shaper IC for X-ray spectroscopy
    • June
    • B. Kriger, I. Kipnis and B. A. Ludewigt, "XPS: A multi-channel preamplifier-shaper IC for X-ray spectroscopy," IEEE Trans. Nucl. Sci., vol. 45, no. 3, pp. 732-734, June 1998.
    • (1998) IEEE Trans. Nucl. Sci , vol.45 , Issue.3 , pp. 732-734
    • Kriger, B.1    Kipnis, I.2    Ludewigt, B.A.3
  • 2
    • 0035355492 scopus 로고    scopus 로고
    • PETRIC - a positron emission tomography readout integrated circuit
    • June
    • M. Pedrali-Noy et al., "PETRIC - a positron emission tomography readout integrated circuit." IEEE Trans. Nucl. Sci., vol. 48, no. 3, pp. 479-483, June 2001.
    • (2001) IEEE Trans. Nucl. Sci , vol.48 , Issue.3 , pp. 479-483
    • Pedrali-Noy, M.1
  • 3
    • 0035355498 scopus 로고    scopus 로고
    • An 8×8 pixel IC for X-ray spectroscopy
    • June
    • B. Krieger et al., "An 8×8 pixel IC for X-ray spectroscopy," IEEE Trans. on Nuclear Science, vol. 48, no. 3, pp. 493-497, June 2001.
    • (2001) IEEE Trans. on Nuclear Science , vol.48 , Issue.3 , pp. 493-497
    • Krieger, B.1
  • 4
    • 34047140677 scopus 로고
    • A low noise CMOS integrated signal processor for multi-element particle detectors
    • Erik H. M. Heijne and Pirre Jarrón, "A low noise CMOS integrated signal processor for multi-element particle detectors," Digest of Papers ESSCIRC, pp. 68-69, 1988.
    • (1988) Digest of Papers ESSCIRC , pp. 68-69
    • Heijne, E.H.M.1    Jarrón, P.2
  • 5
    • 0141695895 scopus 로고
    • Signal processing for semiconductor detectors
    • June
    • F. S. Goulding and D. A. Landis, "Signal processing for semiconductor detectors.", " IEEE Trans. Nucl. Sci., vol. NS-29. pp. 1125-1141, June 1982.
    • (1982) IEEE Trans. Nucl. Sci , vol.NS-29 , pp. 1125-1141
    • Goulding, F.S.1    Landis, D.A.2
  • 6
    • 0025517415 scopus 로고
    • Limits of low noise performance of detector readout front ends in CMOS technology
    • November
    • W. Sansen and Z. Y. Chang, "Limits of low noise performance of detector readout front ends in CMOS technology," IEEE Trans. Circuits Syst., vol.37, no.11, pp.1375-1382, November 1990.
    • (1990) IEEE Trans. Circuits Syst , vol.37 , Issue.11 , pp. 1375-1382
    • Sansen, W.1    Chang, Z.Y.2
  • 9
    • 8744314578 scopus 로고    scopus 로고
    • Effect of Technology on the Input Transistor Selection Criteria of a Low Noise Preamplifier
    • Dubrovnik, Croatia. May 12-15
    • T. Noulis, S. Siskos and G. Sarrabayrouse, "Effect of Technology on the Input Transistor Selection Criteria of a Low Noise Preamplifier," IEEE Mediterranean Electrotechnical Conf., Dubrovnik, Croatia. May 12-15, 2004.
    • (2004) IEEE Mediterranean Electrotechnical Conf
    • Noulis, T.1    Siskos, S.2    Sarrabayrouse, G.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.