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Volumn 52, Issue 6, 2005, Pages 2713-2720

Fast CMOS binary front end for silicon strip detectors at LHC experiments

Author keywords

Front end electronics; Low noise circuits; Noise modeling; Noise optimization

Indexed keywords

CMOS INTEGRATED CIRCUITS; ENERGY DISSIPATION; SILICON;

EID: 33144470922     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2005.862826     Document Type: Conference Paper
Times cited : (51)

References (7)
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    • W. Dabrowski et al., "Design and performance of the ABCD chip for the binary readout of silicon strip detectors in the ATLAS semiconductor tracker," IEEE Trans. Nucl. Sci., pt. 1, vol. 47, no. 6, pp. 1843-1850, Dec. 2000.
    • (2000) IEEE Trans. Nucl. Sci., Pt. 1 , vol.47 , Issue.6 , pp. 1843-1850
    • Dabrowski, W.1
  • 2
    • 0030216336 scopus 로고    scopus 로고
    • A transimpedance amplifier using a novel current mode feedback loop
    • P. Jarron et al., "A transimpedance amplifier using a novel current mode feedback loop," Nucl. Instruments Meth. Phys. Res., vol. A 377, pp. 435-439, 1996.
    • (1996) Nucl. Instruments Meth. Phys. Res. , vol.377 , pp. 435-439
    • Jarron, P.1
  • 4
    • 0029342165 scopus 로고
    • An analytical MOS transistor model valid in all regions of operation and dedicated to low-voltage and low-current applications
    • C. C. Enz et al., "An analytical MOS transistor model valid in all regions of operation and dedicated to low-voltage and low-current applications," Analog Integr. Circuits Signal Process., vol. 8, pp. 83-114, 1995.
    • (1995) Analog Integr. Circuits Signal Process. , vol.8 , pp. 83-114
    • Enz, C.C.1
  • 6
    • 21544484788 scopus 로고    scopus 로고
    • An accurate and efficient high frequency noise simulation technique for deep submicron MOSFETs
    • Dec.
    • J.-S. Goo, "An accurate and efficient high frequency noise simulation technique for deep submicron MOSFETs," IEEE Trans. Electron Dev., vol. 47, no. 12, pp. 2410-2419, Dec. 2000.
    • (2000) IEEE Trans. Electron Dev. , vol.47 , Issue.12 , pp. 2410-2419
    • Goo, J.-S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.