Effects of inhomogeneous fields in superresolving structured-illumination microscopy

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 25, Issue 6, 2008, Pages 1371-1377

  Beversluis, Michael R ^a   Bryant, Garnett W ^a   Stranick, Stephan J ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER NETWORKS;

HIGH FREQUENCIES; ILLUMINATION PATTERNS; INHOMOGENEOUS FIELDS;

MICROSCOPIC EXAMINATION;

EID: 50449091564     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.25.001371     Document Type: Article

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