SCOPUS 정보 검색 플랫폼

Volumn 31, Issue 7, 2006, Pages 945-947

Extended resolution wide-field optical imaging: Objective-launched standing-wave total internal reflection fluorescence microscopy

(3) Chung, Euiheon a Kim, Daekeun a So, Peter T C a

a MASSACHUSETTS INSTITUTE OF TECHNOLOGY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EXTENDED RESOLUTION IMAGING; OPTICAL IMAGING SYSTEM; POINT-SPREAD FUNCTION; RAYLEIGH RESOLUTION; STANDING-WAVE TOTAL-INTERNAL-REFLECTION FLUORESCENCE MICROSCOPY; TOTAL INTERNAL REFLECTION;

DIFFRACTION; FLUORESCENCE; LIGHT REFLECTION; MICROSCOPIC EXAMINATION; OPTICAL RESOLVING POWER; OPTICS;

IMAGING SYSTEMS;

ARTICLE; EQUIPMENT; EQUIPMENT DESIGN; EVALUATION; FIBER OPTICS; FLUORESCENCE MICROSCOPY; IMAGE ENHANCEMENT; INSTRUMENTATION; METHODOLOGY; REFRACTOMETRY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; FIBER OPTICS; IMAGE ENHANCEMENT; MICROSCOPY, FLUORESCENCE; REFRACTOMETRY; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY;

EID: 33646572213 PISSN: 01469592 EISSN: None Source Type: Journal
DOI: 10.1364/OL.31.000945 Document Type: Article

Times cited : (84)

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