메뉴 건너뛰기




Volumn , Issue , 2007, Pages

Optimization of electronics assemblies towards robust design under fracture, delamination and fatigue aspects

Author keywords

[No Author keywords available]

Indexed keywords

BRAZING; DELAMINATION; ELECTRONICS PACKAGING; ESTIMATION; FRACTURE FIXATION; FRACTURE MECHANICS; HIGH TEMPERATURE APPLICATIONS; INDUSTRIAL ENGINEERING; OPTIMIZATION; PHASE INTERFACES; PHOTONICS; PROCESS ENGINEERING; PRODUCT DEVELOPMENT; PROJECT MANAGEMENT; SPEED; STEEL SHEET; STRENGTH OF MATERIALS; STRESSES; TECHNOLOGY; THERMAL SPRAYING; WELDING;

EID: 50249106280     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICEPT.2007.4441403     Document Type: Conference Paper
Times cited : (11)

References (22)
  • 2
    • 0029376557 scopus 로고
    • Bimaterial Interfacial Crack Growth as a Function of Mode-Mixity
    • Sept
    • Liu, Sh., Mei, Y., Wu, T. Y., "Bimaterial Interfacial Crack Growth as a Function of Mode-Mixity", IEEE Trans-CPMT - A, Vol. 18 No. 3, Sept. 1995, pp. 618-626
    • (1995) IEEE Trans-CPMT - A , vol.18 , Issue.3 , pp. 618-626
    • Liu, S.1    Mei, Y.2    Wu, T.Y.3
  • 3
    • 0033333719 scopus 로고    scopus 로고
    • A Study of the Mixed-Mode Interfacial Fracture Toughness of Adhesive Joints Using a Multiaxial Fatigue Tester
    • April
    • Wang, J., Lu, M., Ren, W., Zou, D., Liu, Sh., "A Study of the Mixed-Mode Interfacial Fracture Toughness of Adhesive Joints Using a Multiaxial Fatigue Tester", IEEE Trans. of Electronics Packaging Manufacturing, Vol. 22 No. 2, April 1999, pp. 166-173
    • (1999) IEEE Trans. of Electronics Packaging Manufacturing , vol.22 , Issue.2 , pp. 166-173
    • Wang, J.1    Lu, M.2    Ren, W.3    Zou, D.4    Liu, S.5
  • 4
    • 10444244832 scopus 로고    scopus 로고
    • th Electronic Components and Technology Conference (ECTC 2004), Las Vegas, June 1-4, 2004, IEEE Catalog number 04CH37546C, ISSN: 0569-5503, ISBN: 0-7803-8366-4, pp. 890-894
    • th Electronic Components and Technology Conference (ECTC 2004), Las Vegas, June 1-4, 2004, IEEE Catalog number 04CH37546C, ISSN: 0569-5503, ISBN: 0-7803-8366-4, pp. 890-894
  • 5
    • 0031188288 scopus 로고    scopus 로고
    • The Use of Finite Extension Strain Energy Release Rates in Fracture of Interfacial Cracks
    • Sun, C. T., Qian, W., "The Use of Finite Extension Strain Energy Release Rates in Fracture of Interfacial Cracks", Int. J. Solids Structures, Vol. 34. No. 20, pp. 2595-2609
    • Int. J. Solids Structures , vol.34 , Issue.20 , pp. 2595-2609
    • Sun, C.T.1    Qian, W.2
  • 6
    • 71149121504 scopus 로고    scopus 로고
    • Mixed Mode Cracking in Layered Materials
    • Hutchinson, J. W., Suo, Z., "Mixed Mode Cracking in Layered Materials", Adv. Appl. Mechanics, Vol. 29, pp. 63-191
    • Adv. Appl. Mechanics , vol.29 , pp. 63-191
    • Hutchinson, J.W.1    Suo, Z.2
  • 7
    • 0017561766 scopus 로고    scopus 로고
    • A finite element calculation of stress intensity factors by a modified crack closure integral
    • Rybicki, E. F., Kanninen, M. F., "A finite element calculation of stress intensity factors by a modified crack closure integral", Eng. Fracture Mechanics, Vol. 9, pp. 931-938
    • Eng. Fracture Mechanics , vol.9 , pp. 931-938
    • Rybicki, E.F.1    Kanninen, M.F.2
  • 8
    • 0013400840 scopus 로고    scopus 로고
    • NASA/CR-2002-211628, ICASE Report
    • R. Krueger, "The Virtual Crack Closure Technique: History, Approach and Applications", NASA/CR-2002-211628, ICASE Report, No. 2002-10
    • , Issue.2002-2010
    • Krueger, R.1
  • 9
    • 0036577527 scopus 로고    scopus 로고
    • A Conservative Integral for Determining Stress Intensity Factors of a Bimaterial Notch
    • L. Banks-Sills and A. Sherer, "A Conservative Integral for Determining Stress Intensity Factors of a Bimaterial Notch", Int. Journ. of Fracture, 115, (2002), pp. 1-26
    • (2002) Int. Journ. of Fracture , vol.115 , pp. 1-26
    • Banks-Sills, L.1    Sherer, A.2
  • 10
    • 85196526620 scopus 로고    scopus 로고
    • Auersperg, J., Kieselstein, E., Schubert, A., Michel, B., Mixed Mode Interfacial Fracture Toughness Evaluation for Flip-Chip Assemblies and CSP Based on Fracture Mechanics Approaches, Symp. on Reliability, Stress Analysis, and Failure Prevention of the 2001 ASME IMECE, New York, proc. 2, IMECE2001/DE-25109
    • Auersperg, J., Kieselstein, E., Schubert, A., Michel, B., "Mixed Mode Interfacial Fracture Toughness Evaluation for Flip-Chip Assemblies and CSP Based on Fracture Mechanics Approaches", Symp. on Reliability, Stress Analysis, and Failure Prevention of the 2001 ASME IMECE, New York, proc. Vol. 2, IMECE2001/DE-25109
  • 11
    • 0038288396 scopus 로고    scopus 로고
    • Delamination Risk Evaluation for Plastic Packages Based on Mixed Mode Fracture Mechanics Approaches
    • Dec
    • Auersperg, J., Kieselstein, E., Schubert, A., Michel, B., "Delamination Risk Evaluation for Plastic Packages Based on Mixed Mode Fracture Mechanics Approaches", Trans. of the ASME, JEP, Vol. 124, Dec. 2002, pp. 318-322
    • (2002) Trans. of the ASME, JEP , vol.124 , pp. 318-322
    • Auersperg, J.1    Kieselstein, E.2    Schubert, A.3    Michel, B.4
  • 12
    • 0028497372 scopus 로고
    • Numerical Simulations of Fast Crack Growth in Brittle Solids
    • Xu, X. and Needleman, A., "Numerical Simulations of Fast Crack Growth in Brittle Solids," J. Mech. Phys. Solids, Vol. 42, 1994, pp. 1397-1434
    • (1994) J. Mech. Phys. Solids , vol.42 , pp. 1397-1434
    • Xu, X.1    Needleman, A.2
  • 13
    • 0142088819 scopus 로고    scopus 로고
    • Solution strategies for the delamination analysis based on a combination of local-control arc-length and line searches
    • Alfano, G. and Crisfield, M.A. Solution strategies for the delamination analysis based on a combination of local-control arc-length and line searches, Int. J. Num. Meth. Engng, 58, pp. 999-1048, 2003
    • (2003) Int. J. Num. Meth. Engng , vol.58 , pp. 999-1048
    • Alfano, G.1    Crisfield, M.A.2
  • 14
    • 77649193465 scopus 로고
    • The Mathematical Theory of Equilibrium of Cracks in Brittle Fracture
    • Barenblatt, G. I., "The Mathematical Theory of Equilibrium of Cracks in Brittle Fracture," Adv. Appl. Mechanics, 9, 1962, pp. 55-129
    • (1962) Adv. Appl. Mechanics , vol.9 , pp. 55-129
    • Barenblatt, G.I.1
  • 15
    • 50549180512 scopus 로고
    • Yielding of Steel Sheets Containing Clits
    • Dugdale, D. S., "Yielding of Steel Sheets Containing Clits," J. Mech. Phys. Solids, 8, 1960, pp. 100-104
    • (1960) J. Mech. Phys. Solids , vol.8 , pp. 100-104
    • Dugdale, D.S.1
  • 16
    • 50249098514 scopus 로고    scopus 로고
    • Abaqus User's Manuals, Version 6.5, Hibbitt, Karlsson & Sorensen, Inc. Pawtucket, RI, USA, 2007
    • Abaqus User's Manuals, Version 6.5, Hibbitt, Karlsson & Sorensen, Inc. Pawtucket, RI, USA, 2007
  • 17
    • 33745688237 scopus 로고
    • Investigation of the mechanical-thermal field coupling effect during quasi-static crack growth and application in micro system technology
    • Ulm
    • Auersperg, J.; Dudek, R.; Michel, B, "Investigation of the mechanical-thermal field coupling effect during quasi-static crack growth and application in micro system technology", Proc of the German ABAQUS User Meeting, Ulm 1995, pp. 138-152
    • (1995) Proc of the German ABAQUS User Meeting , pp. 138-152
    • Auersperg, J.1    Dudek, R.2    Michel, B.3
  • 18
    • 84869791566 scopus 로고    scopus 로고
    • th Int. Conf. on Fracture ICF11, Turin (Italy), March 20-25, 2005, Proc on CD
    • th Int. Conf. on Fracture ICF11, Turin (Italy), March 20-25, 2005, Proc on CD
  • 21
    • 50249104265 scopus 로고    scopus 로고
    • Probabilistic Design Approach for Package Design and Solder Joint Reliability Optimization for a Lead Free BGA Package
    • P. Limaye, B. Vandevelde, J. Vd Peer, S. Donders, R. Darveaux, "Probabilistic Design Approach for Package Design and Solder Joint Reliability Optimization for a Lead Free BGA Package", FE-Design Publ., http://www.fe-design.de/ueberblick-titel/abstracts-2005.html#696
    • FE-Design Publ
    • Limaye, P.1    Vandevelde, B.2    Peer, J.V.3    Donders, S.4    Darveaux, R.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.