Atomically precise impurity identification and modification on the manganese doped GaAs(110) surface with scanning tunneling microscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 78, Issue 7, 2008, Pages

  Garleff, J K ^a   Celebi C ^a   Van Roy, W ^b   Tang, J M ^c   Flatte M E ^d   Koenraad, P M ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b IMEC   (Belgium)

^c Univ of New Hampshire   (United States)

^d UNIVERSITY OF IOWA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 50049126709     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.78.075313     Document Type: Article

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