2 X 1 reconstructed Si(111) surface: STM experiments versus ab initio calculations

Physical Review B - Condensed Matter and Materials Physics

Volumn 70, Issue 24, 2004, Pages 1-7

  Garleff, J K ^a   Wenderoth, M ^a   Sauthoff, K ^a   Ulbrich, R G ^a   Rohlfing, M ^b  

^a UNIVERSITY OF GÖTTINGEN   (Germany)

^b JACOBS UNIVERSITY BREMEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AB INITIO CALCULATION; ARTICLE; ATOM; COMPARATIVE STUDY; CONDUCTANCE; ELECTRONICS; SCANNING TUNNELING MICROSCOPY;

EID: 14944352612     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.70.245424     Document Type: Article

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